| Name | Type | Description |
|---|
| ElectroMagneticTrippingUnitType |
P_ENUMERATEDVALUE
/
IfcLabel
/
PEnum_ElectroMagneticTrippingUnitType |
 | Electro Magnetic Tripping Unit Type | A list of the available types of electric magnetic tripping unit from which that required may be selected. These cover overload, none special, short circuit, motor protection and bi-metal tripping. |
 | 闆荤銉堛儶銉冦儣瑁呯疆銈裤偆銉 | 闆荤銉堛儶銉冦儣瑁呯疆銈裤偆銉椼倰閬告姙銇欍倠銆傦紙閬庨浕娴併兓閰嶇窔鐢ㄣ兓銉€兗銈裤兗銉汇儛銈ゃ儭銈裤儷銉汇仢銇粬锛 |
|
| I1 |
P_SINGLEVALUE
/
IfcReal
|
| I1 | The (thermal) lower testing current limit in [x In], indicating that for currents lower than I1, the tripping time shall be longer than the associated tripping time, T2. |
| I1 | 鐔卞嫊寮忋伄浣庤│楱撻浕娴侀檺鐣屽ゃ倰 [x In]銆侀浕娴併伅 I1銆銈堛倞銈備綆銇勫ゃ倰绀恒仚銆傘儓銉儍銉楁檪闁撱伅闁㈤ｃ仚銈 T2 銇檪闁撱倛銈娿倐闀枫亜銆 |
|
| I2 |
P_SINGLEVALUE
/
IfcReal
|
| I2 | The (thermal) upper testing current limit in [x In], indicating that for currents larger than I2, the tripping time shall be shorter than the associated tripping time, T2. |
| I2 | 鐔卞嫊寮忋伄楂樿│楱撻浕娴侀檺鐣屽ゃ倰 [x In], 闆绘祦銇 I2 銈堛倞銈傞珮銇勫ゃ倰绀恒仚銆傘儓銉儍銉楁檪闁撱伅闁㈤ｃ仚銈 T2 銇檪闁撱倛銈娿倐鐭亜銆 |
|
| T2 |
P_SINGLEVALUE
/
IfcTimeMeasure
|
| T2 | The (thermal) testing time in [s] associated with the testing currents I1 and I2. |
| T2 | 鐔卞嫊寮忋伄瑭﹂〒鏅傞枔銈 [s] , 闁㈤ｃ仚銈嬭│楱撻浕娴併倰 I1 銇 I2銆銇ㄣ仚銈嬨 |
|
| DefinedTemperature |
P_SINGLEVALUE
/
IfcThermodynamicTemperatureMeasure
|
| Defined Temperature | The ambient temperature at which the thermal current/time-curve associated with this protection device is defined. |
| 瑷畾娓╁害 | 銇撱伄淇濊瑁呯疆銇屽畾銈併倠娓╁害銉婚浕娴/鏅傞枔-銈兗銉栥伀闁㈤ｃ仚銈嬪懆鍥叉俯搴︺ |
|
| TemperatureFactor |
P_SINGLEVALUE
/
IfcRatioMeasure
|
| Temperature Factor | The correction factor (typically measured as %/deg K) for adjusting the thermal current/time to an ambient temperature different from the value given by the defined temperature. |
| 娓╁害淇傛暟 | 鐔便伄闆绘祦/鏅傞枔銈掋佸畾缇╂笀銇裤伄娓╁害銇倛銇ｃ仸涓庛亪銈夈倢銈嬪ゃ仺鐣般仾銈嬪牬鍚堛伀鍛ㄥ洸娓╁害銇悎銈忋仜銈嬨仧銈併伄瑁滄淇傛暟锛%/deg K 銇ц▓娓仚銈嬶級銆 |
|
| I4 |
P_SINGLEVALUE
/
IfcReal
|
| I4 | The lower electromagnetic testing current limit in [x In], indicating that for currents lower than I4, the tripping time shall be longer than the associated tripping time, T5, i.e. the device shall not trip instantaneous. |
| I4 | 闆荤銇綆瑭﹂〒闆绘祦闄愮晫鍊ゃ倰 [x In], 闆绘祦銇 I4 銈堛倞銈備綆銇勫ゃ倰绀恒仚銆傘儓銉儍銉楁檪闁撱伅闁㈤ｃ仚銈 T5 銇ㄧ灛鏅傘伀閬柇銇欍倠瀹氭牸浣跨敤闆绘祦銇檪闁撱倛銈娿倐闀枫亜銆 |
|
| I5 |
P_SINGLEVALUE
/
IfcReal
|
| I5 | The upper electromagnetic testing current limit in [x In], indicating that for currents larger than I5, the tripping time shall be shorter than or equal to the associated tripping time, T5, i.e. the device shall trip instantaneous. |
| I5 | 闆荤銇珮瑭﹂〒闆绘祦闄愮晫鍊ゃ倰 [x In], 闆绘祦銇 I4 銈堛倞銈備綆銇勫ゃ倰绀恒仚銆傘儓銉儍銉楁檪闁撱伅闁㈤ｃ仚銈 T5 銇ㄧ灛鏅傘伀閬柇銇欍倠瀹氭牸浣跨敤闆绘祦銇檪闁撱倛銈娿倐闀枫亜銆 |
|
| T5 |
P_SINGLEVALUE
/
IfcTimeMeasure
|
| T5 | The electromagnetic testing time in [s] associated with the testing currents I4 and I5, i.e. electromagnetic tripping time |
| T5 | 闆荤銇│楱撴檪闁撱倰 [s] , 闁㈤ｃ仚銈嬭│楱撻浕娴併倰 I4 銇 I5銆銇ㄣ仚銈嬨 |
|
| CurveDesignation |
P_SINGLEVALUE
/
IfcLabel
|
| Curve Designation | The designation of the trippingcurve given by the manufacturer. For a MCB the designation should be in accordance with the designations given in IEC 60898. |
| 鏇茬窔鎸囧畾 | 銉°兗銈兗銇屾彁渚涖仚銈嬫寚瀹氥伄銉堛儶銉冦償銉炽偘銈兗銉栥侻CB銇仧銈併伀銆佹寚瀹氥伅IEC 60898銇簴鎷犮仐銇亼銈屻伆銇倝銇亜銆 |
|
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